Force microscope using a fiber-optic displacement sensor
- 1 November 1988
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (11) , 2337-2340
- https://doi.org/10.1063/1.1139958
Abstract
A force microscope is described which uses a fiber-optic interferometer as the cantilever displacement sensor. Low thermal drift and reduced susceptibility to laser frequency variation are achieved due to the small (several micrometer) size of the interferometer cavity. A sensitivity of 1.7×10−4 Å/(Hz)1/2 is observed for frequencies above 2 kHz. The drift rate of the sensor is on the order of 3 Å/min. As an initial demonstration, laser-written magnetic domains in a thin film sample of TbFeCo were imaged.Keywords
This publication has 11 references indexed in Scilit:
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- High-resolution magnetic imaging of domains in TbFe by force microscopyApplied Physics Letters, 1988
- Observation of magnetic forces by the atomic force microscopeJournal of Applied Physics, 1987
- Atomic resolution imaging of a nonconductor by atomic force microscopyJournal of Applied Physics, 1987
- Atomic force microscopy of liquid-covered surfaces: Atomic resolution imagesApplied Physics Letters, 1987
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Fiber-optic interferometer for remote subangstrom vibration measurementReview of Scientific Instruments, 1984
- Single-mode fibre fractional wave devices and polarisation controllersElectronics Letters, 1980