A differential interferometer for force microscopy
- 1 October 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (10) , 3131-3134
- https://doi.org/10.1063/1.1140543
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]Applied Physics Letters, 1988
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Vibration isolation for scanning tunneling microscopyJournal of Vacuum Science & Technology A, 1987
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Single-tube three-dimensional scanner for scanning tunneling microscopyReview of Scientific Instruments, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Surface profile measurement with a scanning differential ac interferometerApplied Optics, 1984