Atomic resolution on LiF (001) by atomic force microscopy
- 1 February 1990
- journal article
- rapid note
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 79 (1) , 3-4
- https://doi.org/10.1007/bf01387818
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Different Response of Atomic Force Microscopy and Scanning Tunnelling Microscopy to Charge Density WavesEurophysics Letters, 1989
- Comparative study of lithium fluoride and graphite by atomic force microscopy (AFM)Journal of Microscopy, 1988
- Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on siliconJournal of Vacuum Science & Technology A, 1988
- Atomic force microscopy: General aspects and application to insulatorsJournal of Vacuum Science & Technology A, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Atomic resolution imaging of a nonconductor by atomic force microscopyJournal of Applied Physics, 1987
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- The scattering of He atoms from a hard corrugated surface model using the GR method. IThe Journal of Chemical Physics, 1977
- Scattering of He Atoms from Crystal Surfaces: A Tentative Analysis on the Surface Crystallography of LiF(001)Physical Review Letters, 1976