X-ray or neutron reflectivity: Limitations in the determination of interfacial profiles

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Abstract
Although there are an increasing number of proposals for model independent methods by which an index of refraction profile can be extracted from either x-ray or neutron reflectivity data, for many systems there are fundamental limitations to the uniqueness of profiles so determined. The problem arises from the fact that all methods of analysis are ultimately hampered by the fact that the phase information obtained by a reflectivity measurement is incomplete. We discuss the conditions under which uniqueness is, and is not, possible without some external (other than reflectivity) information.