Reflexion electron microscopy at high angles
- 1 February 1958
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 9 (2) , 60-67
- https://doi.org/10.1088/0508-3443/9/2/303
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The scanning electron microscope and its fields of applicationBritish Journal of Applied Physics, 1955
- A replica technique for "reflexion" electron microscopyBritish Journal of Applied Physics, 1955
- A simple reflexion-transmission stage for an electron microscopeJournal of Scientific Instruments, 1955
- The Examination of Oxide Films by Reflection Electron MicroscopyProceedings of the Physical Society. Section B, 1955
- The adaptation of an electron microscope for reflexion and some observations on image formationBritish Journal of Applied Physics, 1953
- Sublichtmikroskopische Auflösungen bei der Abbildung von OberflÄchen im übermikroskopThe European Physical Journal A, 1940
- über Fortschritte bei der Abbildung elektronenbestrahlter OberflÄchenThe European Physical Journal A, 1940
- Die elektronenmikroskopische Abbildung elektronenbestrahlter Oberfl chenThe European Physical Journal A, 1933