The adaptation of an electron microscope for reflexion and some observations on image formation
- 1 August 1953
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 4 (8) , 239-244
- https://doi.org/10.1088/0508-3443/4/8/303
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The origin of specimen contamination in the electron microscopeBritish Journal of Applied Physics, 1953
- The Magnetic Electron Microscope Objective Lens of Lowest Chromatic AberrationProceedings of the Physical Society. Section B, 1952
- A Three-Stage Electron Microscope with Stereographic Dark Field, and Electron Diffraction CapabilitiesJournal of Applied Physics, 1950
- Die elektronenmikroskopische Abbildung elektronenbestrahlter Oberfl chenThe European Physical Journal A, 1933