A Three-Stage Electron Microscope with Stereographic Dark Field, and Electron Diffraction Capabilities
- 1 February 1950
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 21 (2) , 173-182
- https://doi.org/10.1063/1.1699619
Abstract
An electron microscope is described in which a range of magnifications between 1000 and 100,000 times can be covered continuously. This is achieved through the use of an intermediate projector lens. The principles of design are briefly discussed and the construction of the microscope and the high frequency‐operated 100‐kv power unit is dealt with in some detail. The instrument is provided with objective apertures to enhance image contrast and to permit operation with dark field illumination. Data is given relating to the electron optical system and it is shown how the instrument can be used to obtain electron diffraction patterns characteristic of small areas of a specimen under microscopic observation. The alignment procedure is briefly described and some typical micrographs are shown.This publication has 5 references indexed in Scilit:
- A New Experimental Electron MicroscopeJournal of Scientific Instruments, 1948
- The Electron Optical System of the Electron MicroscopeJournal of Scientific Instruments, 1947
- A 100-kv Electron MicroscopeJournal of Applied Physics, 1945
- Radio-Frequency-Operated High-Voltage Supplies for Cathode-Ray TubesProceedings of the IRE, 1943
- Über das primäre und sekundäre Bild im Elektronenmikroskop. II. Strukturuntersuchung mittels ElektronenbeugungAnnalen der Physik, 1936