ac properties of biased MIM structures

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Abstract
Metal-insulator-metal (MIM) systems are considered for the general case where there may or may not be interfacial barriers at the metal-insulator junctions. In the analysis developed, the effects of bias are included. The ac properties of such a general system are derived in the analysis. The resulting expressions for the parallel equivalent resistance and the parallel equivalent capacitance exhibit a wide variety of behavior depending on the interplay of the parameters characterizing the system and the bias. As outlined, the expressions presented may be used to extract information concerning the interface regions, the electric field in the interior of the insulator, and the appropriate energy-band model.