P-type AlAs Growth on a GaAs (311)B Substrate Using Carbon Auto-Doping for Low Resistance GaAs/AlAs Distributed Bragg Reflectors

Abstract
A high p -type hole-concentration AlAs layer has been successfully grown on a GaAs (311)B substrate by metalorganic chemical vapor deposition with using a Carbon auto-doping technique. The doping concentration was well controlled by changing only V/III ratios. The hole concentration was as high as 2 ×1019 cm-3 at a V/III ratio of 6. A very low resistance of p -type distributed Bragg reflector was obtained with a δ-doping technique to GaAs/AlAs interfaces.