0.5-W single transverse-mode operation of an 850-nm diode-pumped surface-emitting semiconductor laser
- 25 June 2003
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 15 (7) , 894-896
- https://doi.org/10.1109/lpt.2003.813446
Abstract
We report the power scaling of a diode-pumped GaAs-based 850-nm vertical external-cavity surface-emitting laser, by use of an intracavity silicon carbide (SiC) heatspreader optically contacted to the semiconductor surface. To our knowledge, this is the first demonstration of bonding of SiC to a III-V semiconductor structure using the technique of liquid capillarity. High output power of >0.5 W in a circularly symmetric, TEM/sub 00/ output beam has been achieved with a spectral shift of only 0.6 nm/W of pump power. No thermal rollover was evident up to the highest pump power available, implying significant further output-power scaling potential using this approach.Keywords
This publication has 8 references indexed in Scilit:
- Diode-pumped semiconductor disk laser with intracavity frequency doubling using lithium triborate (LBO)IEEE Photonics Technology Letters, 2002
- Sub-500-fs soliton-like pulse in a passively mode-locked broadband surface-emitting laser with 100 mW average powerApplied Physics Letters, 2002
- High power and good beam quality at 980 nm from a vertical external-cavity surface-emitting laserJournal of the Optical Society of America B, 2002
- Semiconductor wafer bonding via liquid capillarityApplied Physics Letters, 2000
- Actively stabilized single-frequency vertical-external-cavity AlGaAs laserIEEE Photonics Technology Letters, 1999
- High-power diode-pumped AlGaAs surface-emitting laserApplied Optics, 1999
- Design and characteristics of high-power (<0.5-W CW) diode-pumped vertical-external-cavity surface-emitting semiconductor lasers with circular TEM/sub 00/ beamsIEEE Journal of Selected Topics in Quantum Electronics, 1999
- Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologiesJournal of Applied Physics, 1994