X-Ray Spectrometer Performance as a Function of Electron Probe Geometry
- 1 November 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (12) , 4507-4510
- https://doi.org/10.1063/1.1708070
Abstract
Experimental data were gathered to determine the effect of sample orientation and electron beam incidence on x‐ray spectrometer performance. Dispersive counting techniques were used to compare results. The nature of the backscattered electron yield and the relationship to emitted x radiation is discussed. A wide selection of samples was used to study several wavelengths, including the ultrasoft x‐ray region. Analytical data include line‐to‐background ratios to show the results of various investigated parameters.This publication has 4 references indexed in Scilit:
- A Monte Carlo calculation on the scattering of electrons in copperProceedings of the Physical Society, 1965
- X-Ray Yield and Line/Background Ratios for Electron ExcitationJournal of Applied Physics, 1965
- The angular distribution of characteristic x radiation and its origin within a solid targetProceedings of the Physical Society, 1964
- Methods of Quantitative Electron Probe Analysis*Advances in X-ray Analysis, 1963