AN ENHANCEMENT TO LSSD AND SOME APPLICATIONS OF LSSD IN RELIABILITY, AVAILABILITY, AND SERVICEABILIT
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- LSI chip design for testabilityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978
- Implementation of an Experimental Fault-Tolerant Memory SystemIEEE Transactions on Computers, 1976