Dependence of MOS transistor threshold voltage on substrate resistivity

This publication has 5 references indexed in Scilit:

• The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors
  IEEE Transactions on Electron Devices, 1966
• Field effect studies of the oxidized silicon surface
  Solid-State Electronics, 1966
• Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures
  Solid-State Electronics, 1965
• Characteristics of the metal-Oxide-semiconductor transistors
  IEEE Transactions on Electron Devices, 1964
• Work Function, Photoelectric Threshold, and Surface States of Atomically Clean Silicon
  Physical Review B, 1962