SIMS analysis of doped tungsten
- 1 May 1975
- journal article
- Published by Springer Nature in Metallurgical Transactions A
- Vol. 6 (5) , 991-996
- https://doi.org/10.1007/bf02661351
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Effect of oxygen on the sputtering of aluminium targets bombarded with argon ionsInternational Journal of Mass Spectrometry and Ion Physics, 1973
- A quantum-mechanical model for the ionization and excitation of atoms during sputteringSurface Science, 1973
- Mechanism and kinetics of bubble formation in doped tungstenMetallurgical Transactions, 1971