Increased throughput for the testing and repair of RAMs with redundancy
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 40 (2) , 154-166
- https://doi.org/10.1109/12.73586
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Neural computing for built-in self-repair of embedded memory arraysPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Minimum fault coverage in reconfigurable arraysPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Approaches for the repair of VLSI/WSI RRAMs by row/column deletionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988
- A Fault-Driven, Comprehensive Redundancy AlgorithmIEEE Design & Test of Computers, 1985
- 64Kb ECL RAM with redundancyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1985
- 256K dynamic random access memoryPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1982
- Laser programmable redundancy and yield improvement in a 64K DRAMIEEE Journal of Solid-State Circuits, 1981
- A fault-tolerant 64K dynamic random-access memoryIEEE Transactions on Electron Devices, 1979
- Graph Theory with ApplicationsPublished by Springer Nature ,1976
- An $n^{5/2} $ Algorithm for Maximum Matchings in Bipartite GraphsSIAM Journal on Computing, 1973