Laser programmable redundancy and yield improvement in a 64K DRAM
- 1 October 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 16 (5) , 506-514
- https://doi.org/10.1109/jssc.1981.1051630
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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