Accurate determination of optical constants of absorbing materials: measurements of transmittance and reflectance of thin films on partially metallized substrates
- 1 June 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 69 (2) , L15-L17
- https://doi.org/10.1016/0040-6090(80)90045-0
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- The inverse problem of the phenomenological theory of the optical properties of thin filmsThin Solid Films, 1978
- The determination of the optical constants of thin films from measurements of normal incidence reflectance and transmittanceJournal of Physics D: Applied Physics, 1977
- The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidenceJournal of Physics D: Applied Physics, 1972
- Derivation of Optical Constants of Metals from Thin-Film Measurements at Oblique IncidenceApplied Optics, 1972
- Optical Properties of Metallic FilmsPublished by Elsevier ,1971
- Determination of Optical Constants from Intensity Measurements at Normal IncidenceApplied Optics, 1968