Small-angle x-ray scattering from the surfaces of reversed-phase silicas: Power-law scattering exponents of magnitudes greater than four

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Abstract
The small‐angle x‐ray scattering from fully and partially derivatized porous silicas has been studied. Power‐law‐scattering exponents of magnitude greater than 4 have been found in all cases. The magnitudes of the exponents increased with the alkyl chain length and with the degree of surface derivatization. In a preliminary model to explain these observations, a power‐law‐scattering exponent with magnitude greater than 4 is related to a ‘‘fuzzy’’ pore boundary, in which the density varies continuously at the pore boundary instead of changing discontinuously from a value of zero in the empty pore to the essentially constant density characteristic of the bulk silica, as is usually assumed in analyses of the small‐angle scattering from porous silicas.