Estimation of percentage relaxation in Si/Si1-xGexstrained-layer superlattices
- 1 January 1989
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 4 (1) , 10-15
- https://doi.org/10.1088/0268-1242/4/1/002
Abstract
No abstract availableKeywords
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