Solubility of Flaws in Heavily-Doped Semiconductors
- 1 September 1960
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 119 (5) , 1480-1482
- https://doi.org/10.1103/physrev.119.1480
Abstract
The solubility of a charged impurity in a semiconductor depends upon the Fermi level. This dependence may be understood in terms of a conceptual model in which an impurity is allowed to diffuse in a specimen containing a junction, so that the Fermi level varies in respect to the band edges. If the impurity can exist in many states of charge (i.e., is a "flaw"), then the concentration of flaws with charge times the electronic charge varies as the power of the hole density. Summing the concentrations for the different states of charge gives the solubility and its dependence upon hole concentration, and, hence, Fermi level.
Keywords
This publication has 7 references indexed in Scilit:
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