Mechanism of charge storage in electron-beam or corona-charged silicon-dioxide electrets
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. 26 (1) , 42-48
- https://doi.org/10.1109/14.68225
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Charging, long-term stability, and TSD measurements of SiO/sub 2/ electretsIEEE Transactions on Electrical Insulation, 1989
- ElectretsPublished by Springer Nature ,1987
- Positive charging of fluorinated ethylene propylene copolymer (Teflon) by irradiation with low-energy electronsJournal of Applied Physics, 1984
- Secondary electron emission in the scanning electron microscopeJournal of Applied Physics, 1983
- TSC studies of carrier trapping in electron- and γ-irradiated TeflonJournal of Applied Physics, 1976
- Spatial Depth and Density of Charge in ElectretsJournal of Applied Physics, 1972