Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: A survey
- 1 January 1983
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 23 (1) , 91-112
- https://doi.org/10.1016/0026-2714(83)91372-0
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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