Étude des pièges de l'oxyde d'une structure mos par stimulation thermique
- 31 December 1970
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 6 (6) , 381-395
- https://doi.org/10.1016/0040-6090(70)90001-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Photoemission of Electrons from Silicon into Silicon DioxidePhysical Review B, 1965