Epitaxial strain induced metal insulator transition in La0.9Sr0.1MnO3 and La0.88Sr0.1MnO3 thin films
- 1 January 2000
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (2) , 155-157
- https://doi.org/10.1063/1.125687
Abstract
We are reporting an unexpected metal insulator transition at the ferromagnetic phase-transition temperature for thin films of (<50 nm), grown on a (100) face of substrate. For the thicker films (>50 nm), similar to the single crystal, no such transition is observed below Additionally, we observe the suppression of the features associated with charge or orbital ordering in intentionally La-deficient thin films of (<75 nm). In thin films, transmission electron microscopy reveals a compressive strain due to the epitaxial growth, that is, lattice parameters adopt those of the cubic lattice of As the film thickness increases, coherent microtwinning is observed in the films and the films relax to a orthorhombic structure.
Keywords
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