Direct and post-injection oxide and interface trap generation resulting from low-temperature hot-electron injection
- 1 November 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (9) , 5582-5586
- https://doi.org/10.1063/1.354219
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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