A simple method for the direct measurement of diffraction patterns in the EM400 T transmission electron microscope

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Abstract
A method for the direct measurement of electron diffraction patterns in a Philips EM400T transmission electron microscope is described. Use is made of the diffraction lens shift-tilt coils to bring any desired diffraction spot to the centre of the screen. By monitoring the voltage applied to the coils, the position of any diffraction spot can be determined. After calibration d values and angles between the diffraction spots can be calculated without the need of a photographic recording. Advantages of the method are high speed, combined with accuracy. The conversion of the microscope and the calibration procedure are described and illustrated with some experimental results.