The role of the ionization and stopping cross sections in PIXE thin film thickness measurements
- 1 September 1988
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 34 (3) , 362-368
- https://doi.org/10.1016/0168-583x(88)90057-2
Abstract
No abstract availableKeywords
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