Electromigration in Al/Cu/Al films observed by transmission electron microscopy
- 1 January 1972
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 10, 169-174
- https://doi.org/10.1016/0025-5416(72)90082-1
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
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