New method of drift mobility evaluation in μc-Si:H, basic idea and comparison with time-of-flight
- 1 May 2000
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 266-269, 331-335
- https://doi.org/10.1016/s0022-3093(99)00720-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On the transport properties of microcrystalline siliconJournal of Non-Crystalline Solids, 1998
- Hot Electrons in Amorphous SiliconPhysical Review Letters, 1995
- The study of transport and related properties of amorphous silicon by transient experimentsJournal of Non-Crystalline Solids, 1983