High speed circuit testing using ultrafast optical techniques
- 31 December 1987
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 7 (2-4) , 343-349
- https://doi.org/10.1016/s0167-9317(87)80030-8
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Noncontact electro-optic sampling with a GaAs injection laserElectronics Letters, 1986
- Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrateElectronics Letters, 1984
- Subpicosecond electrical samplingIEEE Journal of Quantum Electronics, 1983
- Picosecond electro-optic sampling systemApplied Physics Letters, 1982