Angular resolved XPS applied to V2O5-based catalysts
- 15 May 1996
- journal article
- Published by Elsevier in Surface Science
- Vol. 352-354, 750-754
- https://doi.org/10.1016/0039-6028(95)01243-5
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Transient Kinetics from the Tap Reactor System: Application to the Oxidation of Propylene to AcroleinJournal of Catalysis, 1995
- Chemical information obtained from Auger depth profiles by means of advanced factor analysis (MLCFA)Applied Surface Science, 1993
- Maximum likelihood common factor analysis in Auger electron spectroscopySurface and Interface Analysis, 1991
- Vanadium oxide monolayer catalysts Preparation, characterization and catalytic activityApplied Catalysis, 1991
- X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallographyCritical Reviews in Solid State and Materials Sciences, 1990
- Dispersion of V2O5 supported on a TiO2 by x-ray photoelectron spectroscopy surfaceApplied Physics A, 1988
- The structure and redox properties of vanadium oxide surface compoundsJournal of Catalysis, 1986
- The phenomenon of wetting at solid/solid interfaceSurface Science, 1985
- Angle-resolved x-ray photoelectron spectroscopyProgress in Surface Science, 1984
- Core-Level Binding Energy and Density of States from the Surface Atoms of GoldPhysical Review Letters, 1978