Luminescence from growth topographic features in GaN:Si films
- 1 January 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 83 (1) , 462-465
- https://doi.org/10.1063/1.366661
Abstract
Cathodoluminescence (CL) in the scanning electron microscope is used to investigate the nature of defects responsible for the luminescence associated with round and hexagonal-like topographic features of GaN:Si films. Round hillocks of the size of a few microns, which sometimes have a nanopipe related central hole, do not influence the luminescence emission of the film. Hillocks with sizes of several tens of microns show a marked CL contrast at the center and at the border. The origin of the observed contrast is attributed to a growth induced inhomogeneous distribution of point defects and impurities. Radiation with the electron beam of the scanning microscope causes a decrease of the CL intensity without spectral changes.This publication has 15 references indexed in Scilit:
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