Elastic recoil detection

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Abstract
In elastic recoil detection (ERD) one determines the yield and energy of particles ejected out of the surface region of samples under MeV ion bombardment. By application of this surface and thin film analysis technique one can obtain quantitative information concerning the depth distribution of light elements in a sample to be analysed. The quantitativity and the depth resolving power are based on knowledge of the recoil cross section and the stopping power of high-energy ions in matter. This paper reviews the fundamentals of this technique and the various experimental methods for recoil identification. Furthermore, important features for material analysis, such as detection limits, depth resolution and elemental range are discussed. Some emphasis is put on the conversion of the spectral contribution of the elements to atomic concentrations in the films for several representative cases. Throughout the review numerous examples are given to illustrate the features of ERD and to demonstrate empirically the accuracy of the quantification method.