Test of SEU algorithms against preliminary CRRES satellite data
- 1 December 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 38 (6) , 1642-1646
- https://doi.org/10.1109/23.124157
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Modeling charge collection and single event upsets in microelectronicsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Estimating the Dimensions of the SEU-Sensitive VolumeIEEE Transactions on Nuclear Science, 1987
- Comparison of Soft Errors Induced by Heavy Ions and ProtonsIEEE Transactions on Nuclear Science, 1986
- Proton-Induced Nuclear Reactions in SiliconIEEE Transactions on Nuclear Science, 1981