Fingerprint spectra in Laser Microprobe Mass Analysis of titanium oxides of different stoichiometry

This publication has 10 references indexed in Scilit:

• Atomic and molecular ion emission from silica in laser microprobe mass analysis (LAMMA): Comparison with secondary ion mass spectrometry (SIMS) and spark source mass spectrometry (SSMS)
  International Journal of Mass Spectrometry and Ion Physics, 1983
• Molecular ion distributions in laser microprobe mass spectrometry of calcium oxide and calcium salts
  Spectrochimica Acta Part B: Atomic Spectroscopy, 1983
• Laser microprobe mass spectrometry. 2. Applications to structural analysis
  Analytical Chemistry, 1982
• Laser microprobe mass spectrometry. 1. Basic principles and performance characteristics
  Analytical Chemistry, 1982
• Laser Microprobe Mass Analysis of NH₄ReO₄, AgReO₄and Al (ReO₄)₃
  Spectroscopy Letters, 1980
• Energy spectra of ions sputtered from elements by O+2: A comprehensive study
  Surface Science, 1979
• Analytical capabilities of laser-probe mass spectrometry
  International Journal of Mass Spectrometry and Ion Physics, 1978
• Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides
  Surface Science, 1977
• Refractive indices of TiO_2 films produced by reactive evaporation of various titanium–oxygen phases
  Applied Optics, 1976
• Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copper
  Radiation Effects, 1973