Atomic and molecular ion emission from silica in laser microprobe mass analysis (LAMMA): Comparison with secondary ion mass spectrometry (SIMS) and spark source mass spectrometry (SSMS)
- 28 February 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 47, 23-26
- https://doi.org/10.1016/0020-7381(83)87127-7
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Ion Formation from Alkali Halide Solids by High Power Pulsed Laser IrradiationZeitschrift für Naturforschung A, 1982
- Atomic and cluster ion emission from silicon in secondary-ion mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Laser-induced cluster-ions from thin foils of metals and semiconductorsInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxidesSurface Science, 1977