Laser-induced cluster-ions from thin foils of metals and semiconductors
- 28 February 1981
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 37 (2) , 135-151
- https://doi.org/10.1016/0020-7381(81)80002-2
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Laser-induced positive and negative molecular ions from thin carbon foilsInternational Journal of Mass Spectrometry and Ion Physics, 1979
- Detector discrimination in sims II. Ion-to-electron converter yield factors for negative ionsInternational Journal of Mass Spectrometry and Ion Physics, 1979
- Detector discrimination in SIMS: Ion-to-electron converter yield factors for positive ionsInternational Journal of Mass Spectrometry and Ion Physics, 1978
- A high-sensitivity laser microprobe mass analyzerApplied Physics A, 1975
- Secondary molecular ion emission from some CuBe and CuAl alloysJournal of Physics B: Atomic and Molecular Physics, 1974
- Secondary emission of molecular ions from light-element targetsRadiation Effects, 1973
- Observation of clusters in a sputtering ion sourceRadiation Effects, 1973
- Alternations in the secondary emission of molecular ions from noble metalsJournal of Physics and Chemistry of Solids, 1971
- Ionization Equilibrium Equation of State.The Astrophysical Journal, 1961
- Large Molecules in Carbon VaporJournal of the American Chemical Society, 1959