Detector discrimination in sims II. Ion-to-electron converter yield factors for negative ions
- 31 January 1979
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 29 (1) , 1-9
- https://doi.org/10.1016/0020-7381(79)80012-1
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Detector discrimination in SIMS: Ion-to-electron converter yield factors for positive ionsInternational Journal of Mass Spectrometry and Ion Physics, 1978
- Investigation of the decelerating field of an electron multiplier under negative ion impactInternational Journal of Mass Spectrometry and Ion Physics, 1973
- Discrimination in electron multipliers for atomic ions II. Comparison of yields for 61 atomsInternational Journal of Mass Spectrometry and Ion Physics, 1973
- Electron multiplier operation for negative ionsInternational Journal of Mass Spectrometry and Ion Physics, 1972
- Emission $eacute$lectronique secondaire d'une cible de molybd$egrave$ne bombard$eacute$e par des ions positifs et n$eacute$gatifs d'un m$ecirc$me $eacute$l$eacute$mentJournal of Physics D: Applied Physics, 1969
- Relative secondary electron coefficients for 40 keV noble gas and alkali metal ions on aluminiumProceedings of the Physical Society, 1964