Tailored waveform modulation calculation for integral Auger spectra
- 1 January 1977
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 48 (1) , 74-82
- https://doi.org/10.1063/1.1134853
Abstract
Basic lock‐in amplifier principles and instrument response function formalism are reviewed to provide a mathematical model for potential modulation signal detection in Auger electron spectroscopy. The effect of sinusoidal modulation on a Gaussian peak is calculated exactly as a function of modulation amplitude. The result illustrates the degree of distortion and linearity of signal strength as a function of modulation. Nonsinusoidal modulations are considered and when proper waveforms are utilized can provide EN (E) and I (E) =FE′N (E′) dE′ measurements directly from the lock‐in amplifier. The removal of troublesome background effects is also accomplished to second‐ and third‐order terms depending upon the modulation used. Results of the application of the various tailored modulation waveforms on Auger spectra are presented.Keywords
This publication has 9 references indexed in Scilit:
- Some aspects of an AES and XPS study of the adsorption of O2 on NiJournal of Vacuum Science and Technology, 1976
- Integral Auger information via tailored modulation techniquesApplied Physics Letters, 1975
- Phase sensitive detection as a means to recover signals buried in noiseJournal of Physics E: Scientific Instruments, 1975
- An interferometric gas analysis system for the measurement of changes in stoichiometry in metal oxidesJournal of Physics E: Scientific Instruments, 1975
- Doubly resonant current-to-voltage converter preamp for surface spectroscopyReview of Scientific Instruments, 1974
- Dynamic background subtraction and the retrieval of threshold signalsReview of Scientific Instruments, 1974
- Quantitative comparison of Ti and TiO surfaces using Auger electron and soft x-ray appearance potential spectroscopiesJournal of Vacuum Science and Technology, 1974
- Instrument Response Functions for Potential Modulation DifferentiationReview of Scientific Instruments, 1972
- Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED OpticsReview of Scientific Instruments, 1969