Nonmonotonic Variations of the Conductance with Electron Density in ∼70-nm-Wide Inversion Layers
- 16 January 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 52 (3) , 224-227
- https://doi.org/10.1103/physrevlett.52.224
Abstract
The conductance of metal-oxide-silicon field-effect transistors with ∼70-nm-wide inversion layers exhibits nonmonotonic variations with electron density below 15 K. The variations are largest at low electron concentrations and are the result of variations of the activation energy . When is largest the current is found to be limited by spatial barriers which contain tunneling channels at discrete energies, as in the model of Azbel.
Keywords
This publication has 5 references indexed in Scilit:
- Resonance tunneling and localization spectroscopySolid State Communications, 1983
- Localization and Electron-Electron Interaction Effects in Submicron-Width Inversion LayersPhysical Review Letters, 1982
- The Wigner glass and conductance oscillations in silicon inversion layersJournal of Physics C: Solid State Physics, 1982
- Conductance in Restricted-Dimensionality Accumulation LayersPhysical Review Letters, 1982
- A percolation treatment of high-field hopping transportJournal of Physics C: Solid State Physics, 1976