Nonmonotonic Variations of the Conductance with Electron Density in ∼70-nm-Wide Inversion Layers

Abstract
The conductance of metal-oxide-silicon field-effect transistors with ∼70-nm-wide inversion layers exhibits nonmonotonic variations with electron density below 15 K. The variations are largest at low electron concentrations and are the result of variations of the activation energy EA. When EA is largest the current is found to be limited by spatial barriers which contain tunneling channels at discrete energies, as in the model of Azbel.

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