Post-hydrogenated chemical vapor deposited amorphous silicon Schottky diodes

Abstract
Amorphous Si Schottky diodes are prepared by chemical vapor deposition and a post- hydrogenation treatment. Capacitance and photocurrent measurements on these diodes as a function of doping are discussed in terms of space-charge characteristics and carrier collection mechanisms. For doped samples a full analysis of the C(ω) and C(V) dependences enables us to obtain the space-charge width and the doping efficiency. A correlation between space-charge width and collection length of photogenerated carriers is obtained in these samples. For undoped diodes the photocurrent versus wavelength dependences are used to analyze the collection efficiency. A power efficiency of 2.5% is obtained for a fully depleted cell without antireflection coating under AMl solar simulator conditions.