IBM Thinkpad radiation testing and recovery during EUROMIR missions
- 1 December 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 42 (6) , 2004-2009
- https://doi.org/10.1109/23.489246
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Single event upsets for Space Shuttle flights of new general purpose computer memory devicesIEEE Transactions on Nuclear Science, 1994
- A verified proton induced latch-up in space (CMOS SRAM)IEEE Transactions on Nuclear Science, 1992
- Techniques to Maximize Software Reliability in Radiation FieldsIEEE Transactions on Nuclear Science, 1986