The use of scanning conduction microscopy to probe abrasion of insulating thin films
- 1 July 1995
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 66 (7) , 3802-3806
- https://doi.org/10.1063/1.1145441
Abstract
The use of scanning force microscopy (SFM) to probe wear processes at interfaces is of considerable interest. A simple modification of the SFM which allows one to make highly spatially resolved measurements of conductivity changes produced by abrasion of thin insulating films on metal substrates is presented here. The technique is demonstrated on fluorocarbon polymer thin filmsdeposited on stainless‐steel substrates.Keywords
This publication has 9 references indexed in Scilit:
- Electrical transients generated by the peel of a pressure sensitive adhesive tape from a copper substrateJournal of Adhesion Science and Technology, 1995
- Electrical transients generated by the peel of a pressure sensitive adhesive tape from a copper substrateJournal of Adhesion Science and Technology, 1995
- Towards a physical understanding of spreading resistance probe technique profilingJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- An integrated scanning tunneling, atomic force and lateral force microscopeReview of Scientific Instruments, 1994
- Recombination on fractal networks: Photon and electron emission following fracture of materialsJournal of Materials Research, 1993
- Laser Ablation and the Production of Polymer FilmsScience, 1993
- Deposition of polytetrafluoroethylene films by laser ablationApplied Physics Letters, 1993
- Contact Electrification and Adhesion Between Dissimilar MaterialsScience, 1992
- Potentiometry for thin-film structures using atomic force microscopyJournal of Vacuum Science & Technology A, 1990