Thermal conductivity of thin metallic films measured by photothermal profile analysis
- 1 March 1997
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 68 (3) , 1510-1513
- https://doi.org/10.1063/1.1147638
Abstract
Thermal conductivity of nickel and gold films on quartz (thickness 0.4–8 μm) was measured by a modulated thermoreflectance technique recording the surface temperature profile. Model calculations predict an optimum frequency for measuring thermal transport within the film. Measurements on films with various thicknesses reveal a thermal conductivity close to the bulk value for nickel while gold films exhibit a reduced conductivity with decreasing film thickness.Keywords
This publication has 17 references indexed in Scilit:
- Photothermal measurement of thermal anisotropy in pyrolytic graphiteApplied Physics B Laser and Optics, 1996
- Measurement of thermal diffusivity of thin films and foils using a laser scanning microscopeReview of Scientific Instruments, 1995
- Thermal diffusivity measurements using linear relations from photothermal wave experimentsReview of Scientific Instruments, 1994
- Photothermal absorption microscopy of defects in ZrO2 and MgF2 single-layer filmsOptical Engineering, 1994
- Harmonic heat flow in isotropic layered systems and its use for thin film thermal conductivity measurementsJournal of Applied Physics, 1994
- Measurement of thermal diffusion in thin films using a modulated laser technique: Application to chemical-vapor-deposited diamond filmsJournal of Applied Physics, 1992
- Thermal conductivity of thin films: Measurements and understandingJournal of Vacuum Science & Technology A, 1989
- Detection of thermal waves through optical reflectanceApplied Physics Letters, 1985
- Photothermal displacement spectroscopy: An optical probe for solids and surfacesApplied Physics A, 1983
- Photoacoustic effect and the physics of wavesAmerican Journal of Physics, 1980