Energy distributions of secondary ions from GaAs
- 1 May 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 16 (1) , 41-43
- https://doi.org/10.1016/0168-583x(86)90224-7
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Stabilization of charge on electrically insulating surfaces during SIMS experiments—experimental and theoretical studies of the specimen isolation methodSurface and Interface Analysis, 1985
- Ionization probability of sputtered atomsPhysical Review B, 1983
- Velocity Dependence of the Ionization Probability of Sputtered AtomsPhysical Review Letters, 1981
- Ion-stimulated desorption of positive halogen ionsPhysical Review B, 1981
- Ionization of Atomic Particles Sputtered from SolidsPhysical Review Letters, 1980
- Energy dependence of the ionization probability of sputtered Cu and NiSurface Science, 1979
- Ionization Mechanism ofSputtered from Hydrogenated SiliconPhysical Review Letters, 1979