Stabilization of charge on electrically insulating surfaces during SIMS experiments—experimental and theoretical studies of the specimen isolation method
- 1 December 1985
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 7 (6) , 275-281
- https://doi.org/10.1002/sia.740070605
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Scanning ion imaging as a diagnostic tool for an ion microscopeSurface and Interface Analysis, 1985
- Analysis for rare earth elements in accessory minerals by specimen isolated secondary ion mass spectrometryNature, 1984
- Suppression of molecular ions in the secondary ion mass spectra of mineralsSurface and Interface Analysis, 1983
- Primary-ion charge compensation in SIMS analysis of insulatorsJournal of Applied Physics, 1979
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976