Quantitative roughness characterization of geological surfaces and implications for radar signature analysis
- 1 January 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Geoscience and Remote Sensing
- Vol. 37 (5) , 2397-2412
- https://doi.org/10.1109/36.789638
Abstract
No abstract availableKeywords
This publication has 46 references indexed in Scilit:
- On the surface roughness characterization for SAR data analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Condition for precise measurement of soil surface roughnessIEEE Transactions on Geoscience and Remote Sensing, 1998
- Description of surface roughness as an approximate self-affine random structureSurface Science, 1995
- Special problems in the estimation of power-law spectra as applied to topographical modelingIEEE Transactions on Geoscience and Remote Sensing, 1994
- Lava flow topographic measurements for radar data interpretationGeophysical Research Letters, 1993
- An empirical model and an inversion technique for radar scattering from bare soil surfacesIEEE Transactions on Geoscience and Remote Sensing, 1992
- Broad bandwidth study of the topography of natural rock surfacesJournal of Geophysical Research, 1985
- Numerical simulation of scattering from simple and composite random surfacesJournal of the Optical Society of America A, 1985
- Problem in the determination of correlation functions IIJournal of the Optical Society of America, 1979
- A problem in the determination of correlation functionsJournal of the Optical Society of America, 1977