Depth profiling of Bi-Sr-Ca-Cu-O thin films by secondary neutrals mass spectroscopy
- 1 October 1993
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 215 (3-4) , 445-457
- https://doi.org/10.1016/0921-4534(93)90249-p
Abstract
No abstract availableKeywords
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