Application of Reflection Electron Microscopy for Surface Science (Observation of Cleaned Crystal Surfaces of Si, Pt, Au and Ag)
- 1 January 1988
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Observation of lattice fringes of the Si(111)–7×7 structure by reflection electron microscopy*Journal of Microscopy, 1986
- Direct imaging of atomic steps in reflection electron microscopyUltramicroscopy, 1984
- Surface structure imaging by electron microscopyJournal of Microscopy, 1984
- Observation of surface treatments on single crystals by reflection electron microscopyUltramicroscopy, 1984
- Reflection electron microscopy (REM) of vicinal surfaces of fcc metalsUltramicroscopy, 1983
- Reflection electron microscopy (REM) of fcc metalsUltramicroscopy, 1983
- Monatom-High Level Electron Microscopy of Metal SurfacesTransactions of the Japan Institute of Metals, 1983
- High resolution surface study by In-situ UHV transmission electron microscopyUltramicroscopy, 1982
- Principles of a TEM specimen device to meet highest requirements: Specimen temperature 5–300 K, cryo transfer, condensation protection, specimen tilt, stage stability for highest resolutionUltramicroscopy, 1981
- Reflection electron microscopy of clean and gold deposited (111) silicon surfacesSurface Science, 1980