Reflection electron microscopy (REM) of vicinal surfaces of fcc metals
- 31 December 1983
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 11 (2-3) , 167-172
- https://doi.org/10.1016/0304-3991(83)90233-4
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Low energy electron diffraction studies of high index crystal surfaces of platinumPublished by Elsevier ,2002
- Reflection electron microscopy of clean and gold deposited (111) silicon surfacesSurface Science, 1980
- Comparative LEED and RHEED examination of stepped surfaces; Application to Cu(111) and GaAs(100) vicinal surfacesSurface Science, 1977
- Surface imaging using diffracted electronsSurface Science, 1976
- Atomic steps on single crystals: Experimental methods and propertiesApplied Physics A, 1976
- Magnification variations in reflection electron microscopy using diffracted beamsUltramicroscopy, 1975
- The adaptation of an electron microscope for reflexion and some observations on image formationBritish Journal of Applied Physics, 1953